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$Text Box: X-Ray Diffraction (XRD) NANOSTAR A reliable, economic and non-destructive method for analyzing nanostructured materials is SAXS (Small-Angle X-ray Scattering). SAXS yields information such as particle sizes and size distributions from 1 to 100 nm, shape and orientation distributions in liquid, powders and bulk samples. The Bruker AXS NANOSTAR, with its intense, collimated primary beam and 2-dimensional detector, has a similar design to a synchrotron SAXS beamline. With a 2-dimensional detector, the misinterpretation of data due to a 0-D or 1-D data collection method is avoided, eliminating the need for restrictive initial assumptions about the sample. In fact, the NANOSTAR analyzes pure sample properties, even if the sample particles are asymmetric or show preferred orientation. Additionally, a real space image with µm SAXS resolution of the sample can be taken by performing Nanography. The NANOSTAR features a brilliant x-ray source Innovative multi-layer optics, which provides an intense, point-like incident beam upon the sample. The HI-STAR detector, a virtually noise-free, real-time 2-d detector with photon counting ability...more Back$